Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

Over the past 10 years, the DRAM market has been one of the toughest commodity businesses in the electronics industry. Bit growth has averaged more than 60% per year, but at the same time, cycles of ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

Power semiconductors such as MOSFETs and IGBTs need measurements and characterization while still on the wafer—for both engineering and production. Thus, you need to probe the wafer. The TESLA200 ...

Experts at the table, part 3: Analog/mixed signal test is still only partly baked; what happens with stacked die; the return of wafer probe. Semiconductor Engineering sat down to discuss current and ...

Seamlessly integrated system combines TITAN™ Probes and MPI's wafer-level expertise to unlock precision measurements for next-generation semiconductors and sub-THz applications This latest milestone ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...

For the PDF version of this article, click here. Lowering costs for new power management devices is a good reason for trying new approaches in the semiconductor industry. One approach is to try to ...