At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...

Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground ...

Left: This is a simulated atomic force microscopy image. In this method, the tip of the microscope scans the surface of the sample (here: a single cobalt phthalocyanine (CoPC) molecule), measuring the ...

The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...