The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...
Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...
Some of you probably know this already, but there’s actually more than one kind of electron microscope. In electronics work, the scanning electron microscope (SEM) is the most common. You hit ...
A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...
According to [Asianometry], no one believed in the scanning electron microscope. No one, that is, except [Charles Oatley].The video below tells the whole story. The Cambridge graduate built radios ...
Using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), the researchers have been able to show how the electrode degrades during use, when performing a standardised stress ...
DELRAY BEACH, Fla., Feb. 3, 2026 /PRNewswire/ -- According to MarketsandMarkets™, the Microscopy Market is projected to grow from about USD 8.81 billion in 2025 to USD 11.44 billion by 2031, at a CAGR ...
Thermo Scientific Maps Software is an imaging and correlative workflow software suite compatible with the full line of Thermo Scientific SEM, DualBeam (FIB SEM) and TEM platforms. Researchers and ...
Coatings are required to remove or diminish the electrical charges that promptly accumulate in a nonconducting material when examined by a high-energy electron beam. Material samples investigated at ...
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Cutting metal inside an electron microscope
Today we are machining some metal inside the scanning electron microscope! By creating a custom fixture, we can manually ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
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