These are scanning electron microscope images of degraded plastic particles showing examples of surface textures on sampled plastic particles. Disclaimer: AAAS and EurekAlert! are not responsible for ...
With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...
A unique laboratory at Michigan Tech captured microscopic photography of snowflakes in a demonstration of the lab's high-powered scanning electron microscope. The Applied Chemical and Morphological ...
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