DUBLIN--(BUSINESS WIRE)--The "Optical Patterned Wafer Inspection Equipment Market: Technology (Dark Field Inspection, Bright Field Inspection), Applications (Consumer Electronics, Automotive, Others) ...

Ultratech Vice President, Marketing Inspection System & Technology Transfer, Shrinivas Shetty explained, “By working with leading-edge memory and logic customers using Ultratech's 3G systems, we were ...

MILPITAS, Calif., July 20, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to ...

DUBLIN--(BUSINESS WIRE)--The "Wafer Inspection Equipment Market - Forecasts from 2019 to 2024" report has been added to ResearchAndMarkets.com's offering. The wafer inspection equipment market is ...

MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...

What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...

For quality control purposes, wafers, such as semiconductor or flat-panel display (FPD) chips, need to be examined under a microscope to verify that they meet specifications related to both circuit ...

KLA has announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection ...

Although designed for defect inspection and 2-D metrology of LED wafers, the ICOS WI-2280 from KLA-Tencor can also be used for the inspection of MEMS and semiconductor wafers spanning 2 in. to 8 in.

Diverse optical wafer defect inspection systems including (a) Brightfield/darkfield imaging system, (b) Dark-field imaging with null ellipsometry, (c) Through-focus scanning imaging microscopy, (d) ...