General discussion in the metrology field tends to revolve around the relative merits of non-contact or contact measurement solutions. However, demand now exists in almost every industry for more ...

Can small shops succeed with advanced machine tools and software? If so, how do they do it? Read on to learn the strategies that have helped Midway Swiss Turn, our 2025 Top Shops Honoree in Shopfloor ...

Measuring super smooth surfaces generally necessitates the use of optical metrology tools, but it is important to note that optical solutions are not all the same. The choice of metrology solution for ...

Stacking chips is making it far more difficult to find existing and latent defects, and to check for things like die shift, leftover particles from other processes, co-planarity of bumps, and adhesion ...

University of Illinois Physics Professor Paul Kwiat and members of his research group have developed a new tool for precision measurement at the nanometer scale in scenarios where background noise and ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

Complex fluids, such as polymer melts and concentrated suspensions, are foundational materials for industrial products, ...

Fig. 1 Overview of the OFN sensor. (A) Schematic diagram of the OFN sensing system; (B) Photographs of the output light when the sensor was untouched, (C) subjected to normal force, and (D) subjected ...

Wide bandgap semiconductor materials are highly useful in power electronics due to their ability to work at high temperatures, power, and frequency. Gallium nitride (GaN) is a wide bandgap ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...