The alpha300 Semiconductor Edition is a sophisticated confocal Raman microscope designed for the chemical analysis of semiconducting materials. This advanced tool helps researchers quickly analyze ...

When Ben Wells, president of Wells R&D (Lincoln, MA), a maker of custom testing solutions for the semiconductor and optical industries, was building a test instrument, he needed to way to stack and ...

For quality control purposes, wafers, such as semiconductor or flat-panel display (FPD) chips, need to be examined under a microscope to verify that they meet specifications related to both circuit ...

Semiconductor circuits (patterns) printed on semiconductor wafers (substrates) are shrinking, while such substrates are becoming larger in physical size. Over the years, the inspection of patterned ...

The Prior Scientific H112 microscope stage offers a travel range of over 300 x 300 mm making it ideal for accurate and precise scanning of semiconductor wafers, photo masks, flat panel displays and ...

You can use the DM8000 M and the DM12000 M optical inspection microscopes from Leica Microsystems for the inspection, process control, and defect analysis of 8-in. and 12-in. semiconductor wafers. An ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...

Some industry sectors such as automotive and medical continue to push for higher and higher reliability levels; however, many fabs are having difficulties achieving them. Current inspection regimes ...

Researchers at the National Institute of Standards and Technology (NIST) have devised a system for manipulating and precisely positioning individual nanowires Researchers at the National Institute of ...

(Nanowerk News) Scientists from the NTU Singapore and the Korea Institute of Machinery & Materials (KIMM) have developed a technique to create a highly uniform and scalable semiconductor wafer, paving ...