Researchers from McMaster University and the University of Pittsburgh have created the first functionally complete logic gate—a NAND gate (short for "NOT AND")—in a soft material using only beams of ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

AI-assisted pen testing is getting better fast, but it's not yet a replacement for human creativity on complex attack chains. What it absolutely shouldn't be doing—same as human testers—is grinding ...

The basics of digital logic are pretty easy to master, and figuring out how the ones and zeroes flow through various kinds of gates is often an interesting exercise. Taking things down a level and ...