Once IC fabrication is complete, engineers use fault models to create test patterns that detect defects. These fault models are typically abstractions of defect behavior based on our experience and ...
Code testing with modern static analysis provides a solution that not only allows developers to identify and fix concurrency defects in new code, it also provides a cost-effective and automated way to ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback